Nanosciences fondation

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Conductivity, shot noise, and hot phonons in bilayer graphene

Mardi 13 Octobre 2009 à 16h00

CNRS Bât E, salle de conférence "Louis Weil" au 3ème étage


Aurélien Fay (Low Temperature Laboratory, Helsinki University of Technology, Finland)


Conductivity and shot noise in graphene contain both interesting information on the nature of transport of charge carriers. For ballistic mono-layer graphene, the conductivity and the excess noise Fano factor are 4e²/πh and 1/3 at the charge neutrality point, respectively [1,2]. At high bias voltage, the electron-electron and electron-phonon interactions should lead to a breakdown of ballistic transport and, therefore, modify conductivity and shot noise.
We have studied electrical conductivity σ and shot noise of bilayer graphene sheets at high bias voltage Vds [3]. As a function of bias, we find a linear increase of σ which is leveled off above Vds~0.2 V. In the linear region, a simple scaling law is found between the bias and gate voltage dependences of σ. The Fano factor F is found to first increase with bias and then reach a maximum at Vds~0.1 V, above which F decreases.
A mean-free-path type model is used to analyze the results. The increase of σ is directly related to the increase of the transmission modes within the bias widows [4]. We assign the saturation of σ and the decrease of F to the creation of optical/zone boundary phonons. F is also used as a thermometer to measure the electronic temperature. This defined temperature is in good agreement with that extracted from the conductivity model.

Refs. :
[1] R. Danneau, F. Wu, M.F. Craciun, S. Russo, M.Y. Tomi, J. Salmilehto, A.F. Morpurgo, and P.J. Hakonen, Phys. Rev. Lett. 100, 196802 (2008); J. Low. Temp. Phys. 153, 374 (2008); Solid State Commum. (in press)
[2] J. Tworzydlo, B. Trauzettel, M. Titov, A. Rycerz, and C.W.J. Beenakker, Phys. Rev. Lett. 96, 246802 (2006)
[3] A. Fay, J.K. Viljas, R. Danneau, F. Wu, M.Y. Tomi, J. Wengler, M. Wiesner, and P.J. Hakonen, arXiv:0904.4446v1
[4] E.B. Sonin, Phys. Rev. B 77, 233408 (2008)



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