Nanoelectronic Devices and Integrations on Silicon Platform - Today and Tomorrow
Friday 23 September 2011 at 12.30pm
Amphi Maison MINATEC
3 parvis Louis Néel - 38000 Grenoble
By Yoshio NISHI,
Department of Electrical Engineering,
Center for Integrated Systems,
Stanford University
Nanosciences Foundation Chair of
Excellence
There
is widely shared concern today that as we approach future technology
nodes of CMOS beyond sub-20nm, diminishing return in device performance
and density combined with serious increase in on-chip power consumption
would force us to seek for possible alternatives beyond simple scaling
of the minimum geometry.
Applications of mechanical strain to MOSFET
channel for improved transport characteristics, material alternatives
for conductive channel of MOSFET such as germanium and/or III-V
semiconductor, intensive study for partial replacement of on-chip
interconnects with optical interconnect, new nonvolatile memory
phenomena thereby feasibility of new memory devices such as resistive
switching are only a part of such efforts in addition to global trend of
going 3D devices and integration. Also mentioned should include a
variety of “nano” materials such as carbon nanotube, graphene,
topological insulator etc, which might capture unique positions in
integrated circuit technology arsenal with further in-depth
understanding and technological break-through for controlling their
characteristics.
This talk will discuss a perspective of a
variety of nanoelectronic devices to be integrated on silicon platform,
and where they would likely be heading toward.
Sandwiches will be available after the end of the presentation. Registration is mandatory on:http://www.minatec.com/midis






